Date of Award
2015
Document Type
Thesis
Degree Name
Master of Science (MS)
Department
Physics
Committee Chair
Don A. Gregory
Committee Member
Lingze Duan
Committee Member
Kiranmayee Kilaru
Committee Member
Brian Ramsey
Subject(s)
X-ray astronomy--United States., X-ray optics., Grazing incidence., X-ray telescopes--Design and construction.
Abstract
An X-ray reflectometer system for the characterization of various soft and hard X-ray optic coatings has been developed and tested. The X-ray reflectivity (XRR) measurement system generates an X-ray beam with a high-output Rigaku rotating anode source (RAS) operational at a voltage range of 5-35 kV and a current range of 10-150 mA. An Amptek Fast SDD (Silicon Drift Detector) is implemented to achieve good count rate efficiency and improve the reflectivity measurements of coatings at larger graze angles. The consistency of these measurements is also investigated and confirmed through an intensive interlaboratory study that included two well-established XRR facilities, Lawrence Livermore National Laboratory and the Smithsonian Astrophysical Observatory’s multilayer coating facility.
Recommended Citation
Gurgew, Danielle, "Design, construction, and testing of an x-ray reflectometer system" (2015). Theses. 159.
https://louis.uah.edu/uah-theses/159