Date of Award


Document Type


Degree Name

Master of Science (MS)



Committee Chair

Don A. Gregory

Committee Member

Lingze Duan

Committee Member

Kiranmayee Kilaru

Committee Member

Brian Ramsey


X-ray astronomy--United States., X-ray optics., Grazing incidence., X-ray telescopes--Design and construction.


An X-ray reflectometer system for the characterization of various soft and hard X-ray optic coatings has been developed and tested. The X-ray reflectivity (XRR) measurement system generates an X-ray beam with a high-output Rigaku rotating anode source (RAS) operational at a voltage range of 5-35 kV and a current range of 10-150 mA. An Amptek Fast SDD (Silicon Drift Detector) is implemented to achieve good count rate efficiency and improve the reflectivity measurements of coatings at larger graze angles. The consistency of these measurements is also investigated and confirmed through an intensive interlaboratory study that included two well-established XRR facilities, Lawrence Livermore National Laboratory and the Smithsonian Astrophysical Observatory’s multilayer coating facility.



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